The PANalytical X’Pert Pro is a multipurpose x-ray diffractometer equipped with a Cu Kα source. The X’Pert Pro is capable of both high-resolution and lower-resolution measurements and enables a wide range of thin film and powder sample analyses. The sample stage with a temperature controller Anton Paar is available. Samples temperature can be varied from -160o C to +400oC.
The X’Pert Pro is a modular system, making it very easy to switch between different measurement modes.