Hitachi TEM HT-7700

A High-vacuum, high-resolution, low-voltage (100 kV) transmission electron microscope.

Mainly used for the analysis of non-conducting beam-sensitive materials, as e.g. polymers, cellulose- and wood-based materials; but not limited to these. Conducting materials are also characterized, such as e.g. composites, solar cells, thin films, particles, etc.

Used for observing small features in a sample: Resolution is 0.2 nm; the samples need to be very thin (<200 nm) or in the form of nanoparticles/nanofibers.