Structural analysis: TEM

Hitachi TEM HT7700 (Japan), equipped with the 2k × 2k CCD camera (AMT XR41, USA) and a W filament. It is a low-voltage (up to 120 kV), low-dose instrument, very suitable for the analysis of beam sensitive materials. The holders can be tilted up to 30° degrees. The diffraction analysis can be performed.