Picture of FE-SEM Hitachi S-4800
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Structural analysis: SEM | Chemical composition analysis: EDS | Sample Preparation: Coating 

High-resolution high-vacuum cold field-emission Hitachi SEM S-4800 (Japan). It is equipped with SE, BSE, STEM and EDS detectors (X-Max 80 SDD EDS detector from Oxford Instruments, UK). For sample grounding the Cressington sputter coater 208HR (Pt:Pd target) is used.

Tool name:
FE-SEM Hitachi S-4800
Area/room:
19-261
Category:
Microscopy
Manufacturer:
Hitachi
Model:
S-4800
Max booking time, day:
6 hours
Max booking time, night:
hours
No. of future bookings:
3

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Fibre and polymer Technology
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