Structural analysis: SEM | Chemical composition analysis: EDS | Sample Preparation: Coating 

High-resolution high-vacuum cold field-emission Hitachi SEM S-4800 (Japan). It is equipped with SE, BSE, STEM and EDS detectors (X-Max 80 SDD EDS detector from Oxford Instruments, UK). For sample grounding the Cressington sputter coater 208HR (Pt:Pd target) is used.

To apply for FE-SEM training/license, please fill in this form and send it to anaria@kth.se:

FPT employees: form

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To apply for EDS training/license, please fill in this form and send it to anaria@kth.se:

FPT employees: form

Other/external to FPT: form