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The PANalytical X’Pert Pro is a multipurpose X-ray diffractometer equipped with a Cu Kα source. The X’Pert Pro is capable of both high-resolution and lower-resolution measurements and enables a wide range of thin film and powder sample analyses. The sample stage with a temperature controller Anton Paar is available. Samples temperature can be varied from -160o C to +400oC. 

The X’Pert Pro is a modular system, making it very easy to switch between different measurement modes.

New users are trained once a month. Inquire with James Gardner (jgardner@kth.se) about when training sessions are available.

Tool name:
2MILab_Powder X-Ray Diffractometer
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Surface analysis and related tools
X’Pert PRO


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